Which of the following can aid in the identification of root causes of defects?

Run charts display data over time and are used to identify trends or shifts, not specifically root causes.

Ishikawa diagrams visually map out all potential causes of a problem, categorized into areas like people, process, equipment, environment, and materials, making them effective for root cause analysis of defects. By systematically exploring contributing factors, these diagrams facilitate a comprehensive understanding of why a defect occurred.

Histograms show the frequency distribution of a dataset and are used to understand data spread and central tendency, not direct root causes.

Pareto charts show the relative frequency of problems or causes in descending order, helping identify the most significant issues, but not the underlying root causes themselves.