SG0-001 · Question #79
When considering the BEST design for a SAN environment, which of the following is the MOST pivotal concept design flaw?
The correct answer is C. Single point of failure. The most critical design flaw in a SAN environment, or any highly available system, is a single point of failure, which can lead to complete system downtime if that component fails.
Question
When considering the BEST design for a SAN environment, which of the following is the MOST pivotal concept design flaw?
Options
- ALong distance connections
- BThree phase power
- CSingle point of failure
- DFully redundant fabrics
How the community answered
(40 responses)- A3% (1)
- B5% (2)
- C83% (33)
- D10% (4)
Why each option
The most critical design flaw in a SAN environment, or any highly available system, is a single point of failure, which can lead to complete system downtime if that component fails.
Long distance connections introduce latency and complexity but are not inherently a design flaw if implemented correctly for purposes like disaster recovery; they are a characteristic, not a flaw for availability.
Three-phase power is an electrical power distribution method and not a SAN design flaw; proper power redundancy is important, but three-phase power itself does not constitute a flaw.
A single point of failure (SPOF) in a SAN design means that the failure of one specific component, such as a single switch, controller, or power supply, will render the entire storage system or a significant portion of it inaccessible. This directly contradicts the fundamental goal of high availability and resilience in a SAN environment.
Fully redundant fabrics are a crucial best practice for SAN design, ensuring high availability by eliminating single points of failure, and therefore represent a desirable design feature, not a flaw.
Concept tested: SAN design principles and single point of failure
Source: https://www.cisco.com/c/en/us/td/docs/switches/datacenter/mds9000/sw/6_2/configuration/guides/fabric/nxos/fc_san_cg/b_fabric_config_nxos_62_chapter_010.html
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