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CTAL-TA_UK · Question #63

CTAL-TA_UK Question #63: Real Exam Question with Answer & Explanation

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Question

Which of the following type of defects is most likely to be detected by using orthogonal arrays?

Options

  • ADefects found by interaction between system and operation environment
  • BDefects in business processes
  • CDefects for a range of related values
  • DDefects caused by the interaction of two variables

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