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CT-AI · Question #119
CT-AI Question #119: Real Exam Question with Answer & Explanation
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Question
In which ONE of the following situations would an ML model be MOST effective at determining the criticality of new defects?
Options
- AA new application which is in the early stages of the first test cycle
- BAn old application with lots of defect records but a brand new development and test team
- CAn old application where defect records are linked to failed tests and production incidents
- DAn old application with few critical defect records and many non-critical defect records
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